Catalog Auction Info

World-Leading Semiconductor Probe Card & Advanced Test Product Manufacturing Facility in Baldwin Park, CA (#62) 05/26/2026 10:00 AM PDT Closed

Starts Ending 05/26/2026 10:00 AM PDT

Auction Info

Lot #163 Non contact Thickness measurement system

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Lot closed - Closed:N/A

 

  • Non contact Thickness measurement system
  • Non contact Thickness measurement system - 2
  • Non contact Thickness measurement system - 3
  • Non contact Thickness measurement system - 4
  • Non contact Thickness measurement system - 5
  • Non contact Thickness measurement system - 6
  • Non contact Thickness measurement system - 7